Time:2026.10.27 10:30-16:00
Location:Hall 13,AWC Theater
Time:2026.10.27 10:30-16:00
Location:Hall 13,AWC Theater
Date | Time | Topics(Proposed) | Speakers(Proposed) |
Oct 27 (Morning) | 10:30-10:40 | Welcome Address | Hosted by: Zaoche |
10:40-11:00 | Automotive-Grade Electronics Reliability Testing Standards (AEC-Q) and Failure Analysis & Traceability | TÜV Rheinland | |
11:05-11:25 | Industrialization of New Soldering & Dispensing Processes and Materials for Automotive Electronics | Organizer | |
11:30-11:50 | Process Optimization and Defect Prevention & Control for Automotive-Grade Precision Soldering | Magic-ray | |
11:50-12:10 | Intelligent Dispensing Process Upgrade and High-Precision Control Technologies for Automotive Electronics | TBA | |
12:10-13:30 | Lunch & Exhibition Visit | ||
Oct 27 (Afternoon) | 13:30-13:50 | Manufacturing Process Compliance and Risk Control for Automotive-Grade Electronics Targeting ASIL-D | TBA |
13:55-14:15 | Packaging Material Iteration and Standardization System Development for Automotive Electronics | Organizer | |
14:20-14:40 | Innovation in High-Density, High-Reliability Automotive-Grade Electronic Packaging Processes | Organizer | |
14:45-15:05 | Flexible Automated Production and Digital Factory Upgrade for Automotive Electronics | JAKA Robotics | |
15:10-15:30 | Automated Quality Control and Traceability System Development for Smart Manufacturing of Automotive Electronics | SIC Marking | |
15:35-15:55 | End-to-End Automation Integration and Practical Deployment of Automotive Electronics Production Lines | HollySys | |
15:55-16:00 | Closing Remarks | ||
*The detailed agenda is subject to on-site arrangements